STRUCTURAL AND CHEMICAL CHARACTERIZATION OF SEMICONDUCTOR INTERFACES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY

被引：0

|

作者：

OURMAZD, A

机构：

来源：

POINT AND EXTENDED DEFECTS IN SEMICONDUCTORS | 1989年 / 202卷

关键词：

D O I：

暂无

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

下载

收藏

页码：135 / 151

页数：17

相关论文

共 50 条

[1] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTOR INTERFACES
GUTAKOVSKII, AK
FEDINA, LI
ASEEV, AL
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1995, 150 (01): : 127 - 140
[2] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTOR INTERFACES
HEYDENREICH, J
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1993, 57 (05): : 375 - 375
[3] CHARACTERIZATION OF INTERFACES BY HIGH-RESOLUTION ELECTRON-MICROSCOPY
CLARKE, DR
THIN SOLID FILMS, 1981, 84 (02) : 129 - 130
[4] HIGH-RESOLUTION ELECTRON-MICROSCOPY OF SEMICONDUCTOR INTERFACES AND SURFACES
GIBSON, JM
JOURNAL OF METALS, 1985, 37 (11): : A92 - A92
[5] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY STUDY OF INTERFACES
DOUIN, J
EPICIER, T
PENISSON, JM
THOREL, A
MATERIALS CHEMISTRY AND PHYSICS, 1992, 32 (01) : 77 - 85
[6] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY OF SEMICONDUCTOR HETEROINTERFACE
ISHIDA, K
SAKAI, A
IKARASHI, N
ONO, H
NEC RESEARCH & DEVELOPMENT, 1991, 32 (04): : 498 - 510
[7] IMAGING OF INTERFACES IN SEMICONDUCTOR-MATERIALS USING HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
PONCE, FA
ULTRAMICROSCOPY, 1982, 9 (03) : 215 - 219
[8] CHARACTERIZATION OF GRAIN-BOUNDARIES AND INTERFACES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
KRAKOW, W
INTERFACES BETWEEN POLYMERS, METALS, AND CERAMICS, 1989, 153 : 103 - 108
[9] STRUCTURAL EVALUATION OF HETERO-EPITAXIAL INTERFACES BY HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
WRIGHT, AC
WILLIAMS, JO
MATERIALS LETTERS, 1985, 3 (03) : 80 - 88
[10] HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPY
BARRY, JC
ANSTIS, GR
MATERIALS FORUM, 1994, 18 : 31 - 50

← 1 2 3 4 5 →