A new UV sensitive positive resist for X-ray masks manufacture

被引:0
|
作者
Voigt, Anja [1 ]
Heinrich, Marina [1 ]
Gruetzner, Gabi [1 ]
Kouba, Josef [2 ]
Scheunemann, H. -U. [2 ]
Rudolph, I. [2 ]
机构
[1] Micro Resist Technol GmbH, D-12555 Berlin, Germany
[2] BESSY, AZM, D-12489 Berlin, Germany
关键词
D O I
10.1007/s00542-008-0559-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
LIGA is a well-established process to fabricate metallic micro parts with high resolution, high precision and very low sidewall roughness by means of X-ray lithography and electroplating. The availability of a precise X-ray mask is a precondition for the final precision of the manufactured micro parts. Typical mask substrate materials, e.g. beryllium, carbon based foils, Si(3)N(4) or SiC show different disadvantages such as low X-ray transparency or high toxicity or high prices or low conductivity or high thermal expansion or surface porosity causing X-ray scattering. For the fabrication of X-ray masks, PMMA with its unique features such as high aspect ratio patterns with high precision, exhibits low sensitivity and the layers preparation is not easy. SU-8, an epoxy-based UV and X-ray sensitive, chemically amplified, negative tone photoresist exhibits high aspect ratio patterns with vertical sidewalls. The difficult remove of the resist after the electroplating process significantly hinders the inspection of the fabricated X-ray mask. We present the use and suitability of an UV sensitive, chemically amplified, viscous, aqueous-alkaline developable, and easy removable positive tone photoresist, XP mr-P 15 AV, exhibiting high aspect ratio patterns with vertical sidewalls for the fabrication of X-ray masks by means of UV lithography on vitreous carbon substrates.
引用
收藏
页码:1447 / 1450
页数:4
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