A new UV sensitive positive resist for X-ray masks manufacture

被引:0
|
作者
Voigt, Anja [1 ]
Heinrich, Marina [1 ]
Gruetzner, Gabi [1 ]
Kouba, Josef [2 ]
Scheunemann, H. -U. [2 ]
Rudolph, I. [2 ]
机构
[1] Micro Resist Technol GmbH, D-12555 Berlin, Germany
[2] BESSY, AZM, D-12489 Berlin, Germany
关键词
D O I
10.1007/s00542-008-0559-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
LIGA is a well-established process to fabricate metallic micro parts with high resolution, high precision and very low sidewall roughness by means of X-ray lithography and electroplating. The availability of a precise X-ray mask is a precondition for the final precision of the manufactured micro parts. Typical mask substrate materials, e.g. beryllium, carbon based foils, Si(3)N(4) or SiC show different disadvantages such as low X-ray transparency or high toxicity or high prices or low conductivity or high thermal expansion or surface porosity causing X-ray scattering. For the fabrication of X-ray masks, PMMA with its unique features such as high aspect ratio patterns with high precision, exhibits low sensitivity and the layers preparation is not easy. SU-8, an epoxy-based UV and X-ray sensitive, chemically amplified, negative tone photoresist exhibits high aspect ratio patterns with vertical sidewalls. The difficult remove of the resist after the electroplating process significantly hinders the inspection of the fabricated X-ray mask. We present the use and suitability of an UV sensitive, chemically amplified, viscous, aqueous-alkaline developable, and easy removable positive tone photoresist, XP mr-P 15 AV, exhibiting high aspect ratio patterns with vertical sidewalls for the fabrication of X-ray masks by means of UV lithography on vitreous carbon substrates.
引用
收藏
页码:1447 / 1450
页数:4
相关论文
共 50 条
  • [41] CHEMICAL AMPLIFICATION FOR THE DESIGN OF SENSITIVE ELECTRON-BEAM AND X-RAY RESIST SYSTEMS
    ITO, H
    ACS SYMPOSIUM SERIES, 1991, 475 : 326 - 342
  • [42] CHEMICAL AMPLIFICATION FOR THE DESIGN OF SENSITIVE E-BEAM AND X-RAY RESIST SYSTEMS
    ITO, H
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1990, 200 : 353 - POLY
  • [43] A NEW OPERATING REGIME FOR ELECTROPLATING THE GOLD ABSORBER ON X-RAY MASKS
    DAUKSHER, WJ
    RESNICK, DJ
    JOHNSON, WA
    YANOF, AW
    MICROELECTRONIC ENGINEERING, 1994, 23 (1-4) : 235 - 238
  • [44] IDENTIFICATION OF SENSITIVE POSITIVE AND NEGATIVE WORKING RESIST MATERIALS FOR PROXIMITY X-RAY-LITHOGRAPHY
    NOVEMBRE, AE
    KOMETANI, JM
    KNUREK, CS
    KUMAR, U
    NEENAN, TX
    MIXON, DA
    NALAMASU, O
    MUNZEL, N
    MICROELECTRONIC ENGINEERING, 1995, 27 (1-4) : 389 - 392
  • [45] X-ray densitometry for panel manufacture
    不详
    FOREST PRODUCTS JOURNAL, 1996, 46 (05) : 17 - 17
  • [46] Manufacture of the coolidge x-ray tube
    Robinson, RC
    Moore, CN
    AMERICAN JOURNAL OF ROENTGENOLOGY, 1920, 7 : 254 - 260
  • [47] TUNGSTEN - AN ALTERNATIVE TO GOLD FOR X-RAY MASKS
    KARNEZOS, M
    RUBY, R
    HEFLINGER, B
    NAKANO, H
    JONES, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 283 - 287
  • [48] STABILITY OF ALIGNMENT MARKS FOR X-RAY MASKS
    ACOSTA, RE
    MALDONADO, JR
    FAIR, R
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 240 - 242
  • [49] DEFECTS IN X-RAY MASKS - DETECTION AND PRINTABILITY
    KLUWE, A
    MULLER, KH
    BETZ, H
    OERTEL, H
    JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1987, 5 (01): : 262 - 265
  • [50] Predicting mechanical distortions in x-ray masks
    Cotte, EP
    Engelstad, RL
    Lovell, EG
    Brooks, CJ
    EMERGING LITHOGRAPHIC TECHNOLOGIES III, PTS 1 AND 2, 1999, 3676 : 429 - 440