Performance and stability of large-area 4H-SiC 10-kV junction barrier Schottky rectifiers

被引:69
|
作者
Hull, Brett A. [1 ]
Sumakeris, Joseph J. [1 ]
O'Loughlin, Michael J. [1 ]
Zhang, Qingchun [1 ]
Richmond, Jim [1 ]
Powell, Adrian R. [1 ]
Imhoff, Eugene A. [2 ]
Hobart, Karl D. [2 ]
Rivera-Lopez, Angel [3 ]
Hefner, Allen R., Jr. [3 ]
机构
[1] Cree Inc, Durham, NC 27703 USA
[2] USN, Res Lab, Washington, DC 20375 USA
[3] Natl Inst Stand & Technol, Gaithersburg, MD 20899 USA
关键词
junction barrier Schottky (JBS) diode; power semiconductor diode; SiC; stability;
D O I
10.1109/TED.2008.926655
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The forward and reverse bias dc characteristics, the long-term stability under forward and reverse bias, and the reverse recovery performance of 4H-SiC junction barrier Schottky (JBS) diodes that are capable of blocking in excess of 10 kV with forward conduction of up to 10 A at a forward voltage of less than 3.5 V (at 25 degrees C are described. The diodes show a positive temperature coefficient of resistance and a stable Schottky barrier height of up to 200 degrees C. The diodes show stable operation under continuous forward current injection at 20 A/cM2 and under continuous reverse bias of 8 kV at 125 degrees C. When switched from a 10-A forward current to a blocking voltage of 3 kV at a current rate-of-fall of 30 A/fLs, the reverse recovery time and the reverse recovery charge are nearly constant at 300 ns and 425 nC, respectively, over the entire temperature range of 25 degrees C-175 degrees C.
引用
收藏
页码:1864 / 1870
页数:7
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