共 50 条
- [41] High voltage P+ polysilicon/N- 6H-SiC heterojunction diodes [J]. ELECTRONICS LETTERS, 1997, 33 (12) : 1086 - 1087
- [42] Characteristics of Schottky diodes on 6H-SiC surfaces after sacrificial anodic oxidation [J]. SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 : 933 - 936
- [45] Accurate modeling of Ni/6H-SiC Schottky barrier diodes (SBD) forward characteristics at high current densities [J]. 2000 INTERNATIONAL SEMICONDUCTOR CONFERENCE, VOLS 1 AND 2, CAS 2000 PROCEEDINGS, 2000, : 193 - 196
- [47] Junction barrier Schottky diodes in 4H-SiC and 6H-SiC [J]. SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 1061 - 1064
- [48] Static and dynamic characteristics of 4H-SiC P+N and 6H-SiC Schottky diodes [J]. IECEC-97 - PROCEEDINGS OF THE THIRTY-SECOND INTERSOCIETY ENERGY CONVERSION ENGINEERING CONFERENCE, VOLS 1-4: VOL.1: AEROSPACE POWER SYSTEMS AND TECHNOL; VOL 2: ELECTROCHEMICAL TECHNOL, CONVERSION TECHNOL, THERMAL MANAGEMENT; VOLS 3: ENERGY SYSTEMS, RENEWABLE ENERGY RESOURCES, ENVIRONMENTAL IMPACT, POLICY IMPACTS ON ENERGY; VOL 4: POST DEADLINE PAPERS, INDEX, 1997, : 312 - 316
- [49] Characterization of Large Area 4H-SiC and 6H-SiC Capacitive Devices at 600 °C [J]. SILICON CARBIDE AND RELATED MATERIALS 2011, PTS 1 AND 2, 2012, 717-720 : 1187 - 1189
- [50] The influence of in-grown stacking faults on the reverse current-voltage characteristics of 4H-SIC Schottky barrier diodes [J]. Silicon Carbide and Related Materials 2006, 2007, 556-557 : 885 - 888