March test and on-chip test circuit of flash memories

被引：0

作者：

Ko, JN ^{[1
]}

Huang, JR ^{[1
]}

Chang, TY ^{[1
]}

机构：

[1] Natl Tsing Hua Univ, Dept Elect Engn, Taipei 300, Taiwan

来源：

PROCEEDINGS OF THE 43RD IEEE MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I-III | 2000年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A March test, namely "March Flash" and an on-chip test circuit are presented to detect all single functional fault model with only 4 elements to gain 100% fault coverage and to detect all the parametric faults, respectively. These two methods can be integrated to solve the testing problems of NAND- and NOR- type flash memories. With the hardware penalty of a 3- or 4-bit counter, test of a flash memory can be achieved in few seconds by adopting these proposed test strategies.

引用

页码：128 / 131

页数：4

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