A compact on-chip ECC for low cost flash memories

被引:23
|
作者
Tanzawa, T
Tanaka, T
Takeuchi, K
Shirota, R
Aritome, S
Watanabe, H
Kemink, G
Shimizu, K
Sato, S
Takeucki, Y
Ohuchi, K
机构
[1] Toshiba Microlectron. Eng. Lab., Toshiba Corporation
[2] Philips Semiconductor, Nijmegen
[3] Tohoku University, Sendai
[4] Toshiba R. and D. Center, Kanagawa
[5] Toshiba Microlectron. Eng. Lab., Toshiba Corporation, Kawasaki
[6] University of Tokyo, Tokyo
关键词
cumulative error rate; flash memory; on-chip ECC; reliability improvement;
D O I
10.1109/4.568829
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A compact on-chip error correcting circuit (ECC) for low cost Flash memories has been developed,The total increase in chip area is 2%, including all cells, sense amplifiers, logic, and wiring associated with the ECC, The proposed on-chip ECC, employing 10 check bits for 512 data bits, has been implemented on an experimental 64M-bit NAND Flash memory, The cumulative sector error rate has been improved from 10(-1) to 10(-10). By transferring read data from the sense amplifiers to the ECC twice, 522-Byte temporary buffers, which are required for the conventional ECC and occupy a large part of the ECC area, have been eliminated, As a result, the area for the circuit has been drastically reduced by a factor of 25, The proposed on-chip ECC has been optimized in consideration of balance between the reliability improvement and the cell area overhead, The power increase has been suppressed to less than 1 mA.
引用
收藏
页码:662 / 669
页数:8
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