Minifab key to low-cost chip production

被引：0
|
作者：
Okumura, K [1 ]
Mitsutake, K
机构：
[1] Univ Tokyo, Tokyo, Japan
[2] Toshiba Semicond Proc Technol Ctr, Kawasaki, Kanagawa, Japan
来源：
SOLID STATE TECHNOLOGY | 2002年 / 45卷 / 02期
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：34 / 34
页数：1
相关论文
共 50 条
  • [31] Internet of Things Could Be Low-Cost 'Connectivity Key'
    Mumford, Richard
    [J]. MICROWAVE JOURNAL, 2016, 59 (03) : 49 - 49
  • [32] Low-cost manufacturing holds the key to LMDS success
    Ortega-Gonzalez, FJ
    Asensio-Lopez, A
    Torregrosa-Penalva, G
    [J]. MICROWAVES & RF, 2001, 40 (05) : 59 - +
  • [33] A NEW TESTING ACCELERATION CHIP FOR LOW-COST MEMORY TESTS
    INOUE, M
    YAMADA, T
    FUJIWARA, A
    [J]. IEEE DESIGN & TEST OF COMPUTERS, 1993, 10 (01): : 15 - 19
  • [34] A low-cost gray prediction search chip for motion estimation
    Jou, JM
    Shiau, YH
    Chen, PY
    Kuang, SR
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-FUNDAMENTAL THEORY AND APPLICATIONS, 2002, 49 (07): : 928 - 938
  • [35] A high-throughput low-cost AES cipher chip
    Lin, TF
    Su, CP
    Huang, CT
    Wu, CW
    [J]. 2002 IEEE ASIA-PACIFIC CONFERENCE ON ASIC PROCEEDINGS, 2002, : 85 - 88
  • [36] CHIP BUILDS LOW-COST PROGRAMMABLE-GAIN AMPLIFIER
    GOODENOUGH, F
    [J]. ELECTRONIC DESIGN, 1984, 32 (07) : 210 - 210
  • [37] SMOKE DETECTOR CHIP MAKES LOW-COST TEMPERATURE ALARM
    PEASE, RA
    [J]. ELECTRONIC DESIGN, 1981, 29 (22) : 198 - &
  • [38] Low-Cost On-Chip Clock Jitter Measurement Scheme
    Omana, Martin
    Rossi, Daniele
    Giaffreda, Daniele
    Metra, Cecilia
    Mak, T. M.
    Rahman, Asifur
    Tam, Simon
    [J]. IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2015, 23 (03) : 435 - 443
  • [39] Low-Cost Allocator Implementations for Networks-on-Chip Routers
    Zhang, Min
    Choy, Chiu-Sing
    [J]. VLSI DESIGN, 2009,
  • [40] Fabrication of Low-cost Microfluidic Chip for Terahertz Detection Applications
    Alfihed, Salman
    Bergen, M. H.
    Holzman, Jonathan F.
    Foulds, Ian G.
    [J]. 2018 13TH ANNUAL IEEE INTERNATIONAL CONFERENCE ON NANO/MICRO ENGINEERED AND MOLECULAR SYSTEMS (NEMS 2018), 2018, : 52 - 55
12345