Trace Elemental Determination Using a Portable Total Reflection X-Ray Fluorescence Spectrometer with a Collodion Film Sample Holder

Using a portable total-reflection X-ray fluorescence (TXRF) spectrometer with a collodion film sample holder, a spectrum of an analyte containing 50 ng of aluminum was measured. The Al K alpha line (1.49 keV) that partially overlaps with the Si K alpha line (1.74 keV) from a quartz glass substrate usually used as a sample holder for TXRF analysis, was clearly detected when using the collodion film sample holder. To investigate the quantitative performance of the portable spectrometer with a collodion film sample holder, the concentrations of Cr, Mn, and Fe in a certified reference material of river water (JSAC 0302-3b), whose certified values are 10.0, 5.1, and 59.6 mu g/L, respectively, were determined by the internal-standard method. We showed that approximate concentrations of these elements were determined.