Development of Ultra-precision Grinder for 300mm Wafers

被引:1
|
作者
Zhu, X. L. [1 ]
Dong, Z. G. [1 ]
Kang, R. K. [1 ]
Guo, D. M. [1 ]
机构
[1] Dalian Univ Technol, Minist Educ, Key Lab Precis & Nontradit Machining Technol, Dalian 116024, Peoples R China
来源
关键词
Wafer grinder; Precision grinding; Silicon wafer; Design; On-line monitoring;
D O I
10.4028/www.scientific.net/AMR.565.609
中图分类号
TH [机械、仪表工业];
学科分类号
0802 ;
摘要
This study presents design of an ultra-precision wafer grinder which incorporates state-of-the-art automatic supervision and control system. The wafer grinder is characterized by wafer surface shape control, grinding forces and wafer thickness monitoring systems. The design provides a totally integrated solution to the ultra-precision grinder that is capable of grinding silicon wafers with surface roughness Ra<3 nm and total thickness variation<2 mu m/300mm.
引用
收藏
页码:609 / 614
页数:6
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