Transient and Static Hybrid-Triggered Active Clamp Design for Power-Rail ESD Protection

被引：18
|
作者：
Lu, Guangyi [1 ]
Wang, Yuan [1 ]
Zhang, Xing [1 ]
机构：
[1] Peking Univ, Inst Microelect, Key Lab Microelect Device & Circuits, Beijing 100871, Peoples R China
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 2016年 / 63卷 / 12期
关键词：
Electrostatic discharge (ESD); static clamp; transient clamp; transmission line pulsing (TLP) test; CIRCUITS;
D O I：
10.1109/TED.2016.2618344
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
A transient and static hybrid-triggered active clamp is proposed in this paper. By skillfully incorporating different detection mechanisms, the proposed clamp achieves enhanced static electrical overstress protection capability over the transient one. Furthermore, the proposed clamp achieves improved electrostatic discharge reaction speed in both human body model and charged device model events over the static one. Moreover, the superior transient-noise immunity of the proposed clamp over traditional transient ones is essentially revealed in this paper. The proposed clamp is successfully verified in a 65-nm bulk CMOS process. In addition, the design flexibility of the proposed clamp for other processes is also deeply discussed in this paper.
引用
收藏
页码：4654 / 4660
页数：7
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