FPGA-based Design of a Self-checking TMR Voter

被引:0
|
作者
Afzaal, Umar [1 ]
Lee, Jeong A. [1 ]
机构
[1] Chosun Univ, Dept Comp Engn, Gwangju, South Korea
关键词
D O I
暂无
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The most common error mitigation scheme used for hardening designs against radiation-induced upsets on FPGAs is Triple Modular Redundancy (TMR). In a TMR system, there are three copies of a module and voting circuits that mask errors by voting for the majority. There are several types of voting circuits which can be classified based on their insertion sites in the design, functionality or the type of data structure to be mitigated. These voters are mostly built from Look-up Tables (LUTs) but these voters just like the design that is hardened by applying TMR are also susceptible to radiation-induced effects. In this paper, we present the design of a self-checking LUT based 1-bit voter intended for those sites where a TMR system reduces to a duplex or a simplex system. Voters on these sites make a single point of failure and the proposed design avoids this situation by attaching multiple voter redundancies to the same output. The operation of the proposed voter has been verified through its hardware implementation and timing simulation.
引用
收藏
页数:4
相关论文
共 50 条
  • [21] On the design of self-checking functional units based on Shannon circuits
    Favalli, M
    Metra, C
    DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION 1999, PROCEEDINGS, 1999, : 368 - 375
  • [22] FPGA-Based Reliable TMR Controller Design for S2A Architectures
    Halawa, Hassan H.
    Daoud, Ramez M.
    Amer, Hassanein H.
    Alkady, Gehad I.
    AbdelKader, Ali
    PROCEEDINGS OF 2015 IEEE 20TH CONFERENCE ON EMERGING TECHNOLOGIES & FACTORY AUTOMATION (ETFA), 2015,
  • [23] Design of self checking circuits based on FPGA
    Kubalík, P
    Kubátová, H
    ICM 2003: PROCEEDINGS OF THE 15TH INTERNATIONAL CONFERENCE ON MICROELECTRONICS, 2003, : 378 - 381
  • [24] Design for self-checking and self-timed datapath
    Yang, JL
    21ST IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 2003, : 417 - 422
  • [25] DESIGN OF SELF-CHECKING SEQUENTIAL-MACHINES
    DHAWAN, S
    DEVRIES, RC
    IEEE TRANSACTIONS ON COMPUTERS, 1988, 37 (10) : 1280 - 1284
  • [26] On the design of self-checking controllers with datapath interactions
    Oikonomakos, Petros
    Zwolinski, Mark
    IEEE TRANSACTIONS ON COMPUTERS, 2006, 55 (11) : 1423 - 1434
  • [27] DESIGN OF SELF-CHECKING BUILT-IN CHECKERS
    LITIKOV, IP
    AUTOMATION AND REMOTE CONTROL, 1991, 52 (03) : 423 - 428
  • [28] DESIGN APPROACH TO SELF-CHECKING PROCESSORS.
    Nanya, Takashi
    Kawamura, Toshiaki
    Systems and Computers in Japan, 1986, 17 (10): : 20 - 33
  • [29] A self-checking ALU design with efficient codes
    Gorshe, SS
    Bose, B
    14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 155 - 161
  • [30] An integrated design approach for self-checking FPGAs
    Bolchini, C
    Salice, F
    Sciuto, D
    Zavaglia, R
    18TH IEEE INTERNATIONAL SYMPOSIUM ON DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS, PROCEEDINGS, 2003, : 443 - 450