Terahertz emission from the structures containing low-temperature-grown GaAs layers

被引:2
|
作者
Krotkus, A
Bertulis, K
Liu, K
Xu, J
Zhang, XC
机构
[1] Inst Semicond Phys, LT-2600 Vilnius, Lithuania
[2] Rensselaer Polytech Inst, Ctr Terahertz Res, Troy, NY 12180 USA
关键词
D O I
10.1088/0268-1242/19/4/148
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We investigate the performance of n-GaAs surface plasmon type emitters of terahertz radiation having surface layers grown by low-temperature molecular beam epitaxy technology. Emitters with Be-doped low-temperature-grown GaAs layers on the surface radiate transients that are up to five times more powerful than those obtained from reference devices without these layers. Moreover, terahertz output from the modified emitters shows much weaker saturation at large optical intensities. Differences in the shapes of terahertz transients generated by both types of devices are discussed in terms, of electron and hole dynamics inside the structures.
引用
收藏
页码:S452 / S453
页数:2
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