An effective design for hierarchical test generation based on strong testability

被引：0

作者：

Ichihara, H ^{[1
]}

Okamoto, N ^{[1
]}

Inoue, T ^{[1
]}

Hosokawa, T ^{[1
]}

Fujiwara, H ^{[1
]}

机构：

[1] Hiroshima City Univ, Grad Sch Informat Sci, Hiroshima, Japan

来源：

14TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2005年

关键词：

hierarchical test generation; strong testability; datapath; test plan;

D O I：

10.1109/ATS.2005.23

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

Hierarchical test generation is an efficient method of test generation for VLSI circuits. In this paper, we study a test plan generation algorithm for hierarchical test based on strong testability. We propose a heuristic algorithm for finding a control forest requiring a small number of hold functions by improving an existing test plan generation algorithm based on strong testability. Experimental results show that the proposed algorithm is effective in reducing additional hold functions, i.e., reducing hardware overhead and delay penalty of datapaths.

引用

页码：288 / 293

页数：6

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