A high di/dt 4H-SiC thyristor with '(sic)-shaped' n-base

被引:1
|
作者
Liu, Qing [1 ]
Pu, Hongbin [1 ]
Wang, Xi [1 ]
Li, Jiaqi [1 ]
机构
[1] Xian Univ Technol, Inst Automat & Informat Engn, Xian, Shaanxi, Peoples R China
基金
中国国家自然科学基金;
关键词
4H-SiC; thyristor; turn-on; turn-on di/dt;
D O I
10.1088/1361-6641/ab0235
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high di/dt 4H-SiC thyristor with (sic)-shaped' n-base is proposed and investigated by simulation. Unlike the conventional SiC thyristors, the proposed SiC thyristor features a lightly-highly-lightly doped ('(sic)-shaped') n-base. By modulating the concentration difference of the top p(+)-n emitter junction its injection efficiency increases. An extra electric field is induced by the existence of an abrupt high-low junction in n-base to force the transit of holes and therefore reduce the recombination. As a result, the turn-on time and turn-on di/dt of the new SiC thyristor are 145 ns and 948 A/cm(2)/mu s, respectively, which are reduced by approximately 72% and increased by approximately 400% compared to conventional SiC thyristors (turn-on time is 514 ns and di/dt is 188 A/cm(2)/mu s).
引用
收藏
页数:8
相关论文
共 50 条
  • [21] Selective growth of 4H-SIC on 4H-SiC substrates using a high temperature mask
    Li, C
    Seiler, J
    Bhat, I
    Chow, TP
    SILICON CARBIDE AND RELATED MATERIALS 2003, PTS 1 AND 2, 2004, 457-460 : 185 - 188
  • [22] High power 4H-SiC thyristors
    Palmour, JW
    Singh, R
    Waltz, DG
    1996 54TH ANNUAL DEVICE RESEARCH CONFERENCE DIGEST, 1996, : 54 - 55
  • [23] High temperature characterization of double base epilayer 4H-SiC BJTs
    张倩
    张玉明
    张义门
    王悦湖
    半导体学报, 2010, 31 (11) : 24 - 28
  • [24] 4H-SiC high temperature spectrometers
    Kalinina, E.
    Strokan, N.
    Ivanov, A. M.
    Sadohin, A.
    Azarov, A.
    Kossov, V.
    Yafaev, R.
    Lashaev, S.
    SILICON CARBIDE AND RELATED MATERIALS 2006, 2007, 556-557 : 941 - +
  • [25] High Mobility 4H-SiC MOSFET
    O'Neill, A.
    Arith, F.
    Urresti, J.
    Vasilevskiy, K.
    Wright, N.
    Olsen, S.
    2018 14TH IEEE INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED CIRCUIT TECHNOLOGY (ICSICT), 2018, : 523 - 526
  • [26] Determination of dV/dt and dI/dt characteristics for high voltage 4H-SiC Schottky diodes with different types of metal-polymeric packages
    Rybalka, S. B.
    Kulchenkov, E. A.
    Demidov, A. A.
    Zhemoedov, N. A.
    Drakin, A. Yu
    Zotin, V. F.
    Shishkina, O. A.
    II INTERNATIONAL SCIENTIFIC CONFERENCE ON APPLIED PHYSICS, INFORMATION TECHNOLOGIES AND ENGINEERING 25, PTS 1-5, 2020, 1679
  • [27] High temperature characterization of double base epilayer 4H-SiC BJTs
    Zhang Qian
    Zhang Yuming
    Zhang Yimen
    Wang Yuehu
    JOURNAL OF SEMICONDUCTORS, 2010, 31 (11) : 1140051 - 1140055
  • [28] High frequency 4H-SiC MOSFETS
    Gudjonsson, G.
    Allerstam, F.
    Nilsson, P.-A.
    Hjelmgren, H.
    Sveinbjornsson, E. O.
    Zirath, H.
    Rodle, T.
    Jos, R.
    SILICON CARBIDE AND RELATED MATERIALS 2006, 2007, 556-557 : 795 - 798
  • [29] High energy N+ ion implantation in 4H-SiC
    Oliviero, E.
    Lazar, M.
    Gardon, A.
    Peaucelle, C.
    Perrat, A.
    Grob, J. J.
    Raynaud, C.
    Planson, D.
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2007, 257 (1-2 SPEC. ISS.): : 265 - 269
  • [30] Fast Switching of 4H-SiC Light Triggered Thyristor by Photoconductive Assistance
    Wang, Xi
    Wan, Yuxi
    Ji, Xuan
    Zhang, Yulei
    Pu, Hongbin
    Wang, Qi
    Chen, Zhiming
    IEEE ELECTRON DEVICE LETTERS, 2025, 46 (03) : 361 - 364