Background sensitivity studies for GEM based detectors using a Geant4 simulation

被引：0

作者：

Vai, Ilaria ^{[1
,2
]}

机构：

[1] Univ Pavia, Dipartimento Fis, Pavia, Italy

[2] Ist Nazl Fis Nucl, Sez Pavia, Pavia, Italy

来源：

23RD INTERNATIONAL CONFERENCE ON COMPUTING IN HIGH ENERGY AND NUCLEAR PHYSICS (CHEP 2018) | 2019年 / 214卷

关键词：

D O I：

10.1051/epjconf/201921402045

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

Triple-GEM detectors were selected by the CMS Collaboration for instrumenting the high ri region of the muon system. This region is characterized by a huge radiation background, mainly composed by neutrons and photons. In this context, a discharge probability test was performed in 2017 at the CHARM facility at CERN, to study the operation of the detector in an environment similar to the one of the CMS muon system. A Geant4 simulation was developed in parallel to the actual test, in order to evaluate the behaviour of the detector. This paper will present this simulation, from the detector geometry implementation to the results obtained in terms of sensitivity and energy deposited into the gas gaps.

引用

页数：8

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