Spectral effects in terahertz apertureless near-field microscopy

被引：0
|
作者：
Astley, Victoria [1 ]
Zhan, Hui [1 ]
Mittleman, Daniel M. [1 ]
机构：
[1] Rice Univ, Dept Elect & Comp Engn, Houston, TX 77251 USA
来源：
2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We observe dramatic changes in the spectrum of radiation scattered from a near-field tip with decreasing tip-sample distance. This arises from a balance between direct tip scattering and signals associated with the near-field image dipole. Copyright 2007 Optical Society of America
引用
下载
收藏
页码：402 / 403
页数：2
相关论文
共 50 条
  • [41] Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy
    Peng, Zhaomin
    Zhang, Dehai
    Ge, Shuqi
    Meng, Jin
    APPLIED SCIENCES-BASEL, 2023, 13 (06):
  • [42] Propagation effects in apertureless near-field optical antennas
    Wang, KL
    Barkan, A
    Mittleman, DM
    APPLIED PHYSICS LETTERS, 2004, 84 (02) : 305 - 307
  • [43] Role of the probe quadrupole moment in apertureless near-field optical microscopy
    S. V. Sukhov
    Optics and Spectroscopy, 2005, 98 : 301 - 307
  • [44] The metal-insulator transition in VO2 studied using terahertz apertureless near-field microscopy
    Zhan, Hui
    Astley, Victoria
    Hvasta, Michael
    Deibel, Jason A.
    Mittleman, Daniel M.
    Lim, Yong-Sik
    APPLIED PHYSICS LETTERS, 2007, 91 (16)
  • [45] An analysis of heterodyne signals in apertureless scanning near-field optical microscopy
    Chuang, Chin-Ho
    Lo, Yu-Lung
    OPTICS EXPRESS, 2008, 16 (22): : 17982 - 18003
  • [46] Apertureless near-field scanning IR microscopy of rough surfaces.
    Akhremitchev, BB
    Walker, GC
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 221 : U71 - U71
  • [47] Role of the probe quadrupole moment in apertureless near-field optical microscopy
    Sukhov, SV
    OPTICS AND SPECTROSCOPY, 2005, 98 (02) : 301 - 307
  • [48] Error signal artifact in apertureless scanning near-field optical microscopy
    Billot, L.
    Lamy de la Chapelle, M.
    Barchiesi, D.
    Chang, S. -H.
    Gray, S. K.
    Rogers, J. A.
    Bouhelier, A.
    Adam, P. -M.
    Bijeon, J. -L.
    Wiederrecht, G. P.
    Bachelot, R.
    Royer, P.
    APPLIED PHYSICS LETTERS, 2006, 89 (02)
  • [49] Role of multipole moment of the probe in apertureless near-field optical microscopy
    Sukhov, SV
    ULTRAMICROSCOPY, 2004, 101 (2-4) : 111 - 122
  • [50] Artifact-free near-field optical imaging by apertureless microscopy
    Labardi, M
    Patane, S
    Allegrini, M
    APPLIED PHYSICS LETTERS, 2000, 77 (05) : 621 - 623
12345