Spectral effects in terahertz apertureless near-field microscopy

被引：0
|
作者：
Astley, Victoria [1 ]
Zhan, Hui [1 ]
Mittleman, Daniel M. [1 ]
机构：
[1] Rice Univ, Dept Elect & Comp Engn, Houston, TX 77251 USA
来源：
2008 CONFERENCE ON LASERS AND ELECTRO-OPTICS & QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE, VOLS 1-9 | 2008年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We observe dramatic changes in the spectrum of radiation scattered from a near-field tip with decreasing tip-sample distance. This arises from a balance between direct tip scattering and signals associated with the near-field image dipole. Copyright 2007 Optical Society of America
引用
下载
收藏
页码：402 / 403
页数：2
相关论文
共 50 条
  • [31] Analysis of the measured signals in apertureless near-field optical microscopy
    Formanek, F
    De Wilde, Y
    Aigouy, L
    ULTRAMICROSCOPY, 2005, 103 (02) : 133 - 139
  • [32] Near-field scanning Raman microscopy using apertureless probes
    Sun, WX
    Shen, ZX
    JOURNAL OF RAMAN SPECTROSCOPY, 2003, 34 (09) : 668 - 676
  • [33] Towards terahertz near-field microscopy
    van der Valk, NCJ
    Planken, PCM
    PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY A-MATHEMATICAL PHYSICAL AND ENGINEERING SCIENCES, 2004, 362 (1815): : 315 - 319
  • [34] Apertureless scanning near-field second-harmonic microscopy
    Zayats, AV
    Sandoghdar, V
    OPTICS COMMUNICATIONS, 2000, 178 (1-3) : 245 - 249
  • [35] STUDY OF NANOPRISMS VIA APERTURELESS NEAR-FIELD OPTICAL MICROSCOPY
    Cheang, Chak-Fong
    Li, Yi-Cheng
    Chiu, Kuo-Chih
    Lin, Chun-Yu
    Chang, Yun-Chorng
    Chen, Shean-Jen
    PHOTONIC AND PHONONIC PROPERTIES OF ENGINEERED NANOSTRUCTURES, 2011, 7946
  • [36] Identification of a resonant imaging process in apertureless near-field microscopy
    Chen, HT
    Kraatz, S
    Cho, GC
    Kersting, R
    PHYSICAL REVIEW LETTERS, 2004, 93 (26)
  • [37] A study of background signals in terahertz apertureless near-field microscopy and their use for scattering-probe imaging
    Astley, Victoria
    Zhan, Hui
    Mendis, Rajind
    Mittleman, Daniel M.
    JOURNAL OF APPLIED PHYSICS, 2009, 105 (11)
  • [38] DIAGNOSTICS OF SEMICONDUCTOR STRUCTURES BY MEANS OF AN APERTURELESS NEAR-FIELD TERAHERTZ MICROSCOPE
    Trukhin, V. N.
    Golubok, A. O.
    Lyutetsky, A. V.
    Matveyev, B. A.
    Pikhtin, N. A.
    Samoilov, L. L.
    Sapozhnikov, I. D.
    Tarasov, I. S.
    Fel'shtyn, M. L.
    Khor'kov, D. P.
    RADIOPHYSICS AND QUANTUM ELECTRONICS, 2012, 54 (8-9) : 577 - 584
  • [39] Diagnostics of semiconductor structures by means of an apertureless near-field terahertz microscope
    V. N. Trukhin
    A. O. Golubo
    A. V. Lyutetsky
    B. A. Matveyev
    N. A. Pikhtin
    L. L. Samoilov
    I. D. Sapozhnikov
    I. S. Tarasov
    M. L. Fel’shtyn
    D. P. Khor’kov
    Radiophysics and Quantum Electronics, 2012, 54 : 577 - 584
  • [40] Spot-size reduction in terahertz apertureless near-field imaging
    Planken, PCM
    van der Valk, NCJ
    OPTICS LETTERS, 2004, 29 (19) : 2306 - 2308
12345