High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range

被引：1
|
作者：
Seely, J. F. [1 ]
Hudson, L. T. [2 ]
Henins, Albert [2 ]
Feldman, U. [1 ]
机构：
[1] Artep Inc, 2922 Excelsior Springs Court, Ellicott City, MD 21042 USA
[2] NIST, Gaithersburg, MD 20899 USA
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 11期
关键词：
SPECTROSCOPY; TRANSMISSION; SPECTRA;
D O I：
10.1063/1.4959918
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A Cauchois transmission-crystal spectrometer has been developed with high crystal resolving power in the 6 keV-15 keV energy range and sufficient sensitivity to record single-shot spectra from the Lawrence Livermore National Laboratory (LLNL) Titan laser and other comparable or more energetic lasers. The spectrometer capabilities were tested by recording the W L transitions from a laboratory source and the extended x-ray absorption fine structure (EXAFS) spectrum through a Cu foil. Published by AIP Publishing.
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页数：3
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