High resolution spectrometer for extended x-ray absorption fine structure measurements in the 6 keV to 15 keV energy range

被引：1

作者：

Seely, J. F. ^{[1
]}

Hudson, L. T. ^{[2
]}

Henins, Albert ^{[2
]}

Feldman, U. ^{[1
]}

机构：

[1] Artep Inc, 2922 Excelsior Springs Court, Ellicott City, MD 21042 USA

[2] NIST, Gaithersburg, MD 20899 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2016年 / 87卷 / 11期

关键词：

SPECTROSCOPY; TRANSMISSION; SPECTRA;

D O I：

10.1063/1.4959918

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A Cauchois transmission-crystal spectrometer has been developed with high crystal resolving power in the 6 keV-15 keV energy range and sufficient sensitivity to record single-shot spectra from the Lawrence Livermore National Laboratory (LLNL) Titan laser and other comparable or more energetic lasers. The spectrometer capabilities were tested by recording the W L transitions from a laboratory source and the extended x-ray absorption fine structure (EXAFS) spectrum through a Cu foil. Published by AIP Publishing.

引用

页数：3

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