Polymer thin film transistor without surface pretreatment on silicon nitride gate dielectric

被引:6
|
作者
Li, Flora M. [3 ]
Dhagat, Parul [1 ,2 ]
Haverinen, Hanna M. [4 ]
McCulloch, Iain [5 ]
Heeney, Martin [5 ]
Jabbour, Ghassan E. [1 ,2 ]
Nathan, Arokia [6 ]
机构
[1] Arizona State Univ, Sch Mat, Tempe, AZ 85284 USA
[2] Arizona State Univ, Flexible Display Ctr, Tempe, AZ 85284 USA
[3] Univ Waterloo, Waterloo, ON N2L 3G1, Canada
[4] Univ Oulu, Elect & Informat Engn Dept, Oulu 90014, Finland
[5] Merck Chem, Southampton S016 7QD, England
[6] UCL, London Ctr Nanotechnol, London WC1H 0AH, England
基金
加拿大自然科学与工程研究理事会;
关键词
D O I
10.1063/1.2927485
中图分类号
O59 [应用物理学];
学科分类号
摘要
It is well known that surface modification of the gate dielectric in organic thin film transistors (TFTs) plays an important role in device performance, often giving rise to severalfold improvements in field-effect mobility. This paper reports on solution-processed polymer TFTs with mobilities comparable to high performance counterparts despite the absence of dielectric surface pretreatment. An effective mobility of 0.1 cm(2)/V s was obtained with poly(2,5-bis(3-dodecylthiophene-2-yl)thieno[3,2-b]thiophene) transistors on silicon nitride gate dielectric. The results indicate that by judicious preparation of the device layers, one can mitigate the need for dielectric surface pretreatment, thereby reducing fabrication complexity without compromising TFT performance. (c) 2008 American Institute of Physics.
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页数:3
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