Performance Comparison of InAs, InSb, and GaSb n-Channel Nanowire Metal-Oxide-Semiconductor Field-Effect Transistors in the Ballistic Transport Limit

被引:7
|
作者
Shimoida, Kenta [1 ]
Tsuchiya, Hideaki [1 ,2 ]
Kamakura, Yoshinari [2 ,3 ]
Mori, Nobuya [2 ,3 ]
Ogawa, Matsuto [1 ]
机构
[1] Kobe Univ, Grad Sch Engn, Dept Elect & Elect Engn, Kobe, Hyogo 6578501, Japan
[2] Japan Sci & Technol Agcy, CREST, Chiyoda Ku, Tokyo 1020076, Japan
[3] Osaka Univ, Div Elect Elect & Informat Engn, Grad Sch Engn, Suita, Osaka 5650871, Japan
基金
日本学术振兴会; 日本科学技术振兴机构;
关键词
CARRIER-TRANSPORT;
D O I
10.7567/APEX.6.034301
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ballistic performances of InAs, InSb, and GaSb nanowire field-effect transistors (NWFETs) were theoretically investigated. We found that InAs and InSb NWFETs exhibit similar device performances due to 1D band structure effects. Furthermore, although these In-based NWFETs suffer from the density-of-states (DOS) bottleneck, a lower power switching is expected. On the other hand, GaSb NWs have multiple energy subbands at conduction band minima, as a result of the projection of L-valleys which thus improves the DOS. In particular, a (110)-oriented GaSb NW has an improved DOS and a high electron velocity simultaneously, and thus, it could be a strong competitor to In-based NWFETs. (C) 2013 The Japan Society of Applied Physics
引用
收藏
页数:4
相关论文
共 50 条
  • [2] Modeling of quasi-ballistic transport in nanowire metal-oxide-semiconductor field-effect transistors
    Lee, Yeonghun
    Kakushima, Kuniyuki
    Natori, Kenji
    Iwai, Hiroshi
    JOURNAL OF APPLIED PHYSICS, 2015, 118 (15)
  • [3] Strain effect and surface orientation on drive current enhancement of ballistic germanium n-channel metal-oxide-semiconductor field-effect transistors
    Chang, Shu-Tong
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (07) : 5345 - 5351
  • [4] HYDROGENATION EFFECT IN AN N-CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR
    LEE, CH
    LEE, CC
    CHANG, KJ
    KIM, SC
    JANG, J
    APPLIED PHYSICS LETTERS, 1991, 58 (02) : 134 - 136
  • [5] Investigation of impact ionization in strained-Si n-channel metal-oxide-semiconductor field-effect transistors
    Kang, Ting-Kuo
    Huang, Po-Chin
    Sa, Yu-Huan
    Wu, San-Lein
    Chang, Shoou-Jinn
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2008, 47 (04) : 2664 - 2667
  • [6] Performance of n-Type InSb and InAs Nanowire Field-Effect Transistors
    Khayer, M. Abul
    Lake, Roger K.
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2008, 55 (11) : 2939 - 2945
  • [7] Functional integrity of flexible n-channel metal-oxide-semiconductor field-effect transistors on a reversibly bistable platform
    Alfaraj, Nasir
    Hussain, Aftab M.
    Sevilla, Galo A. Torres
    Ghoneim, Mohamed T.
    Rojas, Jhonathan P.
    Aljedaani, Abdulrahman B.
    Hussain, Muhammad M.
    APPLIED PHYSICS LETTERS, 2015, 107 (17)
  • [8] Electron mobility enhancement in strained-germanium n-channel metal-oxide-semiconductor field-effect transistors
    Yang, Y.-J.
    Ho, W. S.
    Huang, C.-F.
    Chang, S. T.
    Liu, C. W.
    APPLIED PHYSICS LETTERS, 2007, 91 (10)
  • [9] Strain induced changes in the gate leakage current of n-channel metal-oxide-semiconductor field-effect transistors
    Yang, Xiaodong
    Choi, Younsung
    Lim, Jisong
    Nishida, Toshikazu
    Thompson, Scott
    JOURNAL OF APPLIED PHYSICS, 2011, 110 (01)
  • [10] Physical Origin of Drive Current Enhancement in Ultrathin Ge-on-Insulator n-Channel Metal-Oxide-Semiconductor Field-Effect Transistors under Full Ballistic Transport
    Takagi, Shinichi
    Takenaka, Mitsuru
    JAPANESE JOURNAL OF APPLIED PHYSICS, 2011, 50 (01)