Testability Design Based on Relevance of Circuit Nodes and Fault Diagnosis

被引：0

作者：

Chen, Liying ^{[1
]}

Zhai, Guofu ^{[1
]}

Ye, Xuerong ^{[1
]}

Zhang, Kaixin ^{[1
]}

Zhao, Wei ^{[2
]}

机构：

[1] Harbin Inst Technol, Sch Elect Engn & Automat, Harbin, Heilongjiang, Peoples R China

[2] State Grid Jibei Elect Power Co Ltd, Maintence Branch, Beijing, Peoples R China

来源：

2017 PROGNOSTICS AND SYSTEM HEALTH MANAGEMENT CONFERENCE (PHM-HARBIN) | 2017年

基金：

中国国家自然科学基金;

关键词：

board-level circuits; testability design; selection of test points; fault diagnosis; ANALOG; SELECTION;

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

As an important part of electronic products and systems, the fault prediction and health management of board-level circuits has attracted wide attention and the testability design is the basis of the related studies. In this paper, a new method of testability design based on the correlation of circuit nodes is proposed and used to realize the selection of test points in a high-voltage power supply. First of all, all nodes in the circuit are grouped based on correlation analysis, and then calculate the distance between the fault class according to the existing fault data to select the test points of the circuit. Finally, extract the fault features of the selected test points and diagnose the fault. The results verifies the effectiveness of the proposed method in this paper.

引用

页码：1159 / 1163

页数：5

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