Simulation-based testability analysis and fault diagnosis

被引：9

作者：

Sen, SJ ^{[1
]}

Nath, SS ^{[1
]}

Malepati, VN ^{[1
]}

Pattipati, KR ^{[1
]}

机构：

[1] UNIV CONNECTICUT,DEPT ELECT & SYST ENGN,STORRS,CT 06269

来源：

AUTOTESTCON '96 - THE SYSTEM READINESS TECHNOLOGY CONFERENCE: TEST TECHNOLOGY AND COMMERCIALIZATION, CONFERENCE RECORD | 1996年

关键词：

D O I：

10.1109/AUTEST.1996.547688

中图分类号：

V [航空、航天];

学科分类号：

08 ; 0825 ;

摘要：

引用

页码：136 / 148

页数：13

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