Simulation-based testability analysis and fault diagnosis

被引：9
|
作者：
Sen, SJ [1 ]
Nath, SS [1 ]
Malepati, VN [1 ]
Pattipati, KR [1 ]
机构：
[1] UNIV CONNECTICUT,DEPT ELECT & SYST ENGN,STORRS,CT 06269
来源：
AUTOTESTCON '96 - THE SYSTEM READINESS TECHNOLOGY CONFERENCE: TEST TECHNOLOGY AND COMMERCIALIZATION, CONFERENCE RECORD | 1996年
关键词：
D O I：
10.1109/AUTEST.1996.547688
中图分类号：
V [航空、航天];
学科分类号：
08 ; 0825 ;
摘要：
引用
收藏
页码：136 / 148
页数：13
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