Testability Analysis Based on Complex-Field Fault Modeling

被引：0

作者：

Fontana, Giuseppe ^{[1
]}

Grasso, Francesco ^{[1
]}

Luchetta, Antonio ^{[1
]}

Manetti, Stefano ^{[1
]}

Piccirilli, Maria Cristina ^{[1
]}

Reatti, Alberto ^{[1
]}

机构：

[1] Univ Florence, Dept Informat Engn, Florence, Italy

来源：

15TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN (SMACD 2018) | 2018年

关键词：

Testability analysis; ambiguity groups; fault diagnosis; fault signatures; ANALOG; DIAGNOSIS;

D O I：

暂无

中图分类号：

TP39 [计算机的应用];

学科分类号：

081203 ; 0835 ;

摘要：

Testability analysis of linear time-invariant networks under the single-fault scenario is considered in this paper. To this end an interesting technique is proposed which does not require the analytic expression of the input-to-output network function. It is based on a fault model in the complex plane. The validity of the developed method is proved through applicative examples. A comparison with other similar techniques is also included.

引用

页码：33 / 36

页数：4

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