Testability Analysis Based on Complex-Field Fault Modeling

被引：0
|
作者：
Fontana, Giuseppe [1 ]
Grasso, Francesco [1 ]
Luchetta, Antonio [1 ]
Manetti, Stefano [1 ]
Piccirilli, Maria Cristina [1 ]
Reatti, Alberto [1 ]
机构：
[1] Univ Florence, Dept Informat Engn, Florence, Italy
来源：
15TH INTERNATIONAL CONFERENCE ON SYNTHESIS, MODELING, ANALYSIS AND SIMULATION METHODS AND APPLICATIONS TO CIRCUIT DESIGN (SMACD 2018) | 2018年
关键词：
Testability analysis; ambiguity groups; fault diagnosis; fault signatures; ANALOG; DIAGNOSIS;
D O I：
暂无
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
Testability analysis of linear time-invariant networks under the single-fault scenario is considered in this paper. To this end an interesting technique is proposed which does not require the analytic expression of the input-to-output network function. It is based on a fault model in the complex plane. The validity of the developed method is proved through applicative examples. A comparison with other similar techniques is also included.
引用
收藏
页码：33 / 36
页数：4
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