Testability Design Based on Relevance of Circuit Nodes and Fault Diagnosis

As an important part of electronic products and systems, the fault prediction and health management of board-level circuits has attracted wide attention and the testability design is the basis of the related studies. In this paper, a new method of testability design based on the correlation of circuit nodes is proposed and used to realize the selection of test points in a high-voltage power supply. First of all, all nodes in the circuit are grouped based on correlation analysis, and then calculate the distance between the fault class according to the existing fault data to select the test points of the circuit. Finally, extract the fault features of the selected test points and diagnose the fault. The results verifies the effectiveness of the proposed method in this paper.