Temperature effects on MOSFET driving capability and voltage gain

被引:3
|
作者
Chen, K
Huang, JH
Ma, JZ
Liu, ZH
Jeng, MC
Ko, PK
Hu, C
机构
[1] INTEL CORP,SANTA CLARA,CA
[2] CADENCE DESIGN SYST,SAN JOSE,CA 95134
关键词
D O I
10.1016/0038-1101(95)00197-2
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper attempts to discuss some important temperature effects on MOSFET analogue applications. For this purpose, measurement data taken over wide ranges of temperature (91-400 K) and channel length (0.35-50 mu m) on MOSFET driving capability, output resistance, and voltage gain are presented. It is shown that low temperature has greater benefit on current driving capability For analogue devices which have longer L and lower V-g values than digital ones. For constant voltage (V-g - Y-t) bias, output resistance and voltage gain drop at flow temperatures. However, under the constant current I-ds bias, considerably higher gain can be achieved at low temperatures.
引用
收藏
页码:699 / 701
页数:3
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