Temperature dependence of the minority-carrier mobility-lifetime product for probing band-tail states in microcrystalline silicon

被引：0

|

作者：

Brüggemann, R ^{[1
]}

Kunz, O ^{[1
]}

机构：

[1] Carl von Ossietzky Univ Oldenburg, Fachbereich Phys, D-26111 Oldenburg, Germany

来源：

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2002年 / 234卷 / 03期

关键词：

D O I：

10.1002/1521-3951(200212)234:3<R16::AID-PSSB999916>3.0.CO;2-6

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

收藏

页码：R16 / R18

页数：3

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