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- [2] MOSFET performance of 4H-, 6H-, and 15R-SiC processed by dry and wet oxidation SILICON CARBIDE AND RELATED MATERIALS - 1999 PTS, 1 & 2, 2000, 338-3 : 1109 - 1112
- [3] Polytype dependence of transition metal-related deep levels in 4H-, 6H- and 15R-SiC SILICON CARBIDE AND RELATED MATERIALS 2001, PTS 1 AND 2, PROCEEDINGS, 2002, 389-3 : 573 - 576
- [7] Surface morphological structures of 4H-, 6H- and 15R-SiC (0001) epitaxial layers grown by chemical vapor deposition JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2001, 40 (5A): : 3315 - 3319
- [8] Surface morphological structures of 4H-, 6H- and 15R-SiC (0001) epitaxial layers grown by chemical vapor deposition Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 2001, 40 (5 A): : 3315 - 3319
- [9] Nanometer-scale investigation of Schottky contacts and conduction band structure on 4H-, 6H- and 15R-SiC using ballistic electron emission microscopy SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2, 1998, 264-2 : 813 - 816
- [10] Nanometer-scale investigation of Schottky contacts and conduction band structure on 4H-, 6H- and 15R-SiC using ballistic electron emission microscopy Materials Science Forum, 1998, 264-268 (pt 2): : 813 - 816