Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity

被引：19
|
作者：
Schubert, A. [1 ]
Bergamaschi, A. [2 ]
David, C. [2 ]
Dinapoli, R. [2 ]
Elbracht-Leong, S. [1 ]
Gorelick, S. [2 ]
Graafsma, H. [3 ]
Henrich, B. [2 ]
Johnson, I. [2 ]
Lohmann, M. [3 ]
Mozzanica, A. [2 ]
Radicci, V. [2 ]
Rassool, R. [1 ]
Schaedler, L. [2 ]
Schmitt, B. [2 ]
Shi, X. [2 ]
Sobott, B. [1 ]
机构：
[1] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia
[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
[3] DESY, DE-22607 Hamburg, Germany
来源：
JOURNAL OF SYNCHROTRON RADIATION | 2012年 / 19卷
关键词：
synchrotron radiation instrumentation; charge integrating; strip detectors; SPATIAL-RESOLUTION;
D O I：
10.1107/S090904951200235X
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
A synchrotron beam has been used to test the spatial resolution of a single-photon-resolving integrating readout-chip coupled to a 320 mu m-thick silicon strip sensor with a dedicated readout system. Charge interpolation methods have yielded a spatial resolution of sx? 1.8 mu m for a 20 mu m-pitch strip.
引用
收藏
页码：359 / 365
页数：7
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