Micrometre resolution of a charge integrating microstrip detector with single photon sensitivity

被引：19

作者：

Schubert, A. ^{[1
]}

Bergamaschi, A. ^{[2
]}

David, C. ^{[2
]}

Dinapoli, R. ^{[2
]}

Elbracht-Leong, S. ^{[1
]}

Gorelick, S. ^{[2
]}

Graafsma, H. ^{[3
]}

Henrich, B. ^{[2
]}

Johnson, I. ^{[2
]}

Lohmann, M. ^{[3
]}

Mozzanica, A. ^{[2
]}

Radicci, V. ^{[2
]}

Rassool, R. ^{[1
]}

Schaedler, L. ^{[2
]}

Schmitt, B. ^{[2
]}

Shi, X. ^{[2
]}

Sobott, B. ^{[1
]}

机构：

[1] Univ Melbourne, Sch Phys, Melbourne, Vic 3010, Australia

[2] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[3] DESY, DE-22607 Hamburg, Germany

来源：

JOURNAL OF SYNCHROTRON RADIATION | 2012年 / 19卷

关键词：

synchrotron radiation instrumentation; charge integrating; strip detectors; SPATIAL-RESOLUTION;

D O I：

10.1107/S090904951200235X

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A synchrotron beam has been used to test the spatial resolution of a single-photon-resolving integrating readout-chip coupled to a 320 mu m-thick silicon strip sensor with a dedicated readout system. Charge interpolation methods have yielded a spatial resolution of sx? 1.8 mu m for a 20 mu m-pitch strip.

引用

页码：359 / 365

页数：7

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