Optimization of substrate pretreatment and deposition conditions for epitaxial growth of β-FeSi2 film on Si(100)

被引:0
|
作者
Yamaguchi, Kenji [1 ]
Hamamoto, Satoshi [2 ]
Hojou, Kiichi [1 ]
机构
[1] Japan Atom Energy Agcy, Quantum Beam Sci Directorate, 2-4 Shirakata Shirane, Tokai, Ibaraki 3191195, Japan
[2] Ibaraki Univ, Grad Sch Sci & Engn, Mito, Ibaraki 3108512, Japan
关键词
beta-FeSi2; epitaxial growth; ion beam sputter deposition; sputter-etching; BEAM SPUTTER-DEPOSITION; THIN-FILMS;
D O I
10.1002/pssc.201300355
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Effect of substrate treatment conditions, deposition temperature and deposition rate on the crystallinity of beta-FeSi2 films formed on Si substrate was investigated. The substrates were treated with Ne+ ion beams at room temperature and then annealed at 1073 K prior to film fabrication by means of ion beam sputter deposition (IBSD) method. Combinations of experimental parameters which promote the film growth with an epitaxial relationship of beta-FeSi2 (100) // Si (100) were identified. These results were explained qualitatively in terms of the substrate treatment conditions, deposition temperature, as well as on the local Fe/ Si ratio. The observed dependence of the film structure on these experimental parameters indicated that careful optimization of substrate treatment conditions and deposition parameters would further stimulate effort to fabricate beta-FeSi2 films with excellent crystalline properties. (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:1699 / 1703
页数:5
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