Proton induced multilevel storage capability in self-assembled indium-zinc-oxide thin-film transistors

被引:9
|
作者
Guo, Li Qiang [1 ]
Wan, Chang Jin [1 ,2 ]
Zhu, Li Qiang [1 ]
Wan, Qing [1 ,2 ]
机构
[1] Chinese Acad Sci, Ningbo Inst Mat Technol & Engn, Ningbo 315201, Zhejiang, Peoples R China
[2] Nanjing Univ, Sch Elect Sci & Engn, Nanjing 210093, Jiangsu, Peoples R China
基金
中国国家自然科学基金; 中国博士后科学基金;
关键词
FIELD-EFFECT TRANSISTORS; MEMORY DEVICES;
D O I
10.1063/1.4821067
中图分类号
O59 [应用物理学];
学科分类号
摘要
Multilevel memory capability of self-assembled indium-zinc-oxide (IZO) electric-double-layer (EDL) thin-film transistors gated by nanogranular SiO2 proton conducting electrolytes is investigated. More than four distinct memory states are obtained by programming gate voltage. The observed multilevel storage behavior is mainly due to the controlled interfacial electrochemical doping of IZO channel by penetrated protons under programmed gate voltages. In addition, such IZO-based EDL transistor multilevel memory exhibits good characteristics of programming/erasing endurance and data retention. Such oxide-based EDL transistors with proton-induced multilevel memory behavior are interesting for low-cost memory and neuromorphic system applications after further properties and size optimization. (C) 2013 AIP Publishing LLC.
引用
收藏
页数:5
相关论文
共 50 条
  • [21] High performance indium-zinc-oxide thin-film transistors fabricated with a back-channel-etch-technique
    Xu, Hua
    Lan, Linfeng
    Xu, Miao
    Zou, Jianhua
    Wang, Lei
    Wang, Dan
    Peng, Junbiao
    APPLIED PHYSICS LETTERS, 2011, 99 (25)
  • [22] Performance enhancement of amorphous indium-zinc-oxide thin film transistors by microwave annealing
    Xu, Rui
    He, Jian
    Li, Wei
    Paine, David C.
    APPLIED SURFACE SCIENCE, 2015, 357 : 1915 - 1919
  • [23] Preparation and characterization of molybdenum-doped indium-zinc-oxide thin film transistors
    Yang, Zhao
    Wang, NaiQian
    Qu, MingYue
    Pu, HaiFeng
    Zhang, Qun
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015, 30 (04)
  • [24] Influences of Nitrogen Doping on the Electrical Characteristics of Indium-Zinc-Oxide Thin Film Transistors
    Han, Yanbing
    Yan, Hai
    Tsai, Yun-Chu
    Li, Yan
    Zhang, Qun
    Shieh, Han-Ping D.
    IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2016, 16 (04) : 642 - 646
  • [25] Storage-period dependent bias-stress instability of solution-processed amorphous indium-zinc-oxide thin-film transistors
    Kim, Jung-Hye
    Kim, Joonwoo
    Jeong, Soon Moon
    Jeong, Jaewook
    CURRENT APPLIED PHYSICS, 2015, 15 : S64 - S68
  • [26] Significant Performance Improvement of Oxide Thin-Film Transistors by a Self-Assembled Monolayer Treatment
    Cai, Wensi
    Zhang, Jiawei
    Wilson, Joshua
    Brownless, Joseph
    Park, Seonghyun
    Majewski, Leszek
    Song, Aimin
    ADVANCED ELECTRONIC MATERIALS, 2020, 6 (05):
  • [27] Low-Voltage Transparent Indium-Zinc-Oxide Coplanar Homojunction TFTs Self-Assembled on Inorganic Proton Conductors
    Sun, Jia
    Jiang, Jie
    Lu, Aixia
    Zhou, Bin
    Wan, Qing
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2011, 58 (03) : 764 - 768
  • [28] Capillary-Force-Pattern Formation of Indium-Zinc-Oxide Thin-Film Transistor
    Shin, Hyunji
    Kim, Dongwook
    Park, Jaehoon
    Song, Seong-Ho
    Choi, Jong Sun
    JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2019, 19 (04) : 2179 - 2182
  • [29] Aluminum Oxide/Fluoride Self-Assembled Monolayer Double Gate Dielectric for Solution-Processed Indium Oxide Thin-Film Transistors
    Wang, Xiao-Lin
    Shan, Fei
    Zhao, Han-Lin
    Lee, Jae-Yun
    Yoo, Suchang
    Ryu, Heung Gyoon
    Choi, Seungkeun
    Anvar, Tukhtaev
    Kim, Sung-Jin
    ELECTRONIC MATERIALS LETTERS, 2022, 18 (05) : 423 - 430
  • [30] Tailored Self-Assembled Monolayer using Chemical Coupling for Indium-Gallium-Zinc Oxide Thin-Film Transistors: Multifunctional Copper Diffusion Barrier
    Lee, Seungmin
    Lee, Sanghyeon
    Lee, Minkyu
    Rho, Sung Min
    Kim, Hyung Tae
    Won, Chihyeong
    Yoon, Kukro
    Kwon, Chaebeen
    Kim, Juyoung
    Park, Geun Chul
    Lim, Jun Hyung
    Park, Joon Seok
    Kwon, Woobin
    Park, Young-Bae
    Chun, Dong Won
    Kim, Hyun Jae
    Lee, Taeyoon
    ACS APPLIED MATERIALS & INTERFACES, 2022, 14 (50) : 56310 - 56320