Flexible Amorphous Indium-Tin-Zinc Oxide (a-ITZO) Thin-Film Transistors on Polyimide Substrate

被引:0
|
作者
Yang, Dae-Gyu [1 ]
Kim, Jong-Heon [1 ]
Kim, Hyoung-Do [1 ]
Kim, Hyun-Suk [1 ]
机构
[1] Chungnam Natl Univ, Mat Sci & Engn, Daeduck 305764, Daejeon, South Korea
基金
新加坡国家研究基金会;
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中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The amorphous Indium-Tin-Zinc Oxide (a-ITZO) was fabricated by using direct-current (DC) sputtering method. Electrical and chemical properties of a-ITZO thin film transistors (TFTs) fabricated on the polyimide (PI) substrate were investigated. The a-ITZO TFTs on the PI substrate exhibited the saturation field effect mobility of 8.93 cm(2)/Vs, subthreshold swing of 0.38 V/decade and high on/off current ratio of similar to 10(8). Stability under the negative bias stress (NBS), negative bias illumination stress (NBIS) and positive bias stress (PBS) was evaluated.
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页码:165 / 168
页数:4
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