I-DDQ testing: Issues present and future

被引：33
|
作者：
Soden, JM [1 ]
Hawkins, CF [1 ]
机构：
[1] UNIV NEW MEXICO, ALBUQUERQUE, NM 87131 USA
来源：
IEEE DESIGN & TEST OF COMPUTERS | 1996年 / 13卷 / 04期
关键词：
D O I：
10.1109/54.544537
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
I-DDQ testing has progressed to become a mainstream test method, but two issues confront this highly efficient test practice. One issue is the cost impact of product loss due to increased defect detection. The other is the increased background current associated with the new deep-submicron technologies.
引用
收藏
页码：61 / 65
页数：5
相关论文
共 50 条
  • [1] High resolution I-DDQ characterization and testing - Practical issues
    Righter, AW
    Soden, JM
    Beegle, RW
    INTERNATIONAL TEST CONFERENCE 1996, PROCEEDINGS, 1996, : 259 - 268
  • [2] Deep sub-micron I-DDQ testing: Issues and solutions
    Sachdev, M
    EUROPEAN DESIGN & TEST CONFERENCE - ED&TC 97, PROCEEDINGS, 1997, : 271 - 278
  • [3] I-DDQ TESTING FINDS FURTHER FAULTS
    NOVELLINO, J
    ELECTRONIC DESIGN, 1995, 43 (18) : 77 - &
  • [4] An efficient compact test generator for I-DDQ testing
    Kondo, H
    Cheng, KT
    PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96), 1996, : 177 - 182
  • [5] On estimating bounds of the quiescent current for I-DDQ testing
    Ferre, A
    Figueras, J
    14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 106 - 111
  • [6] Delta I-DDQ Testing of CMOS Data Converters
    Yellampalli, S.
    Srivastava, A.
    JOURNAL OF ACTIVE AND PASSIVE ELECTRONIC DEVICES, 2009, 4 (1-2): : 63 - 89
  • [7] A PRACTICAL CURRENT SENSING TECHNIQUE FOR I-DDQ TESTING
    TANG, JJ
    LEE, KJ
    LIU, BD
    IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 1995, 3 (02) : 302 - 310
  • [8] MICROPROCESSOR I-DDQ TESTING - A CASE-STUDY
    JOSEPHSON, D
    STOREY, M
    DIXON, D
    IEEE DESIGN & TEST OF COMPUTERS, 1995, 12 (02): : 42 - 52
  • [9] Possibilities and limitations of I-DDQ Testing in submicron CMOS
    Figueras, J
    SECOND ANNUAL IEEE INTERNATIONAL CONFERENCE ON INNOVATIVE SYSTEMS IN SILICON, 1997 PROCEEDINGS, 1997, : 174 - 185
  • [10] Dealing with yield losses in I-DDQ testing: Viewpoint
    Hawkins, CF
    Soden, JM
    IEEE SPECTRUM, 1996, 33 (01) : 68 - 69
12345