An efficient compact test generator for I-DDQ testing

被引：5
|
作者：
Kondo, H [1 ]
Cheng, KT [1 ]
机构：
[1] KAWASAKI STEEL CHEM IND CO LTD,LSI DIV,MIHAMA KU,CHIBA 26101,JAPAN
来源：
PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96) | 1996年
关键词：
D O I：
10.1109/ATS.1996.555156
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：177 / 182
页数：6
相关论文
共 50 条
  • [1] PLUG-AND-PLAY I-DDQ TESTING FOR TEST FIXTURES
    BAKER, K
    HALES, A
    IEEE DESIGN & TEST OF COMPUTERS, 1995, 12 (03): : 53 - 61
  • [2] Reliability, test, and I-DDQ measurements
    Hawkins, CF
    Keshavarzi, A
    Soden, JM
    IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1997, : 96 - 102
  • [3] REDUCING THE CMOS RAM TEST COMPLEXITY WITH I-DDQ AND VOLTAGE TESTING
    SACHDEV, M
    JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 1995, 6 (02): : 191 - 202
  • [4] I-DDQ TEST AND DIAGNOSIS OF CMOS CIRCUITS
    ISERN, E
    FIGUERAS, J
    IEEE DESIGN & TEST OF COMPUTERS, 1995, 12 (04): : 60 - 67
  • [5] I-DDQ TESTING FINDS FURTHER FAULTS
    NOVELLINO, J
    ELECTRONIC DESIGN, 1995, 43 (18) : 77 - &
  • [6] I-DDQ testing: Issues present and future
    Soden, JM
    Hawkins, CF
    IEEE DESIGN & TEST OF COMPUTERS, 1996, 13 (04): : 61 - 65
  • [7] Some faults need an I-ddq test
    Makar, SR
    McCluskey, EJ
    1996 IEEE INTERNATIONAL WORKSHOP ON IDDQ TESTING, DIGEST OF PAPERS, 1996, : 102 - 103
  • [8] I-DDQ test invalidation by break faults
    Dalpasso, M
    Favalli, M
    Olivo, P
    ELECTRONICS LETTERS, 1996, 32 (11) : 994 - 995
  • [9] TEST-GENERATION FOR I-DDQ TESTING OF BRIDGING FAULTS IN CMOS CIRCUITS
    BOLLINGER, SW
    MIDKIFF, SF
    IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 1994, 13 (11) : 1413 - 1418
  • [10] On estimating bounds of the quiescent current for I-DDQ testing
    Ferre, A
    Figueras, J
    14TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1996, : 106 - 111
12345