An efficient compact test generator for I-DDQ testing

被引：5
|
作者：
Kondo, H [1 ]
Cheng, KT [1 ]
机构：
[1] KAWASAKI STEEL CHEM IND CO LTD,LSI DIV,MIHAMA KU,CHIBA 26101,JAPAN
来源：
PROCEEDINGS OF THE FIFTH ASIAN TEST SYMPOSIUM (ATS '96) | 1996年
关键词：
D O I：
10.1109/ATS.1996.555156
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：177 / 182
页数：6
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