Effect of anneling on ferroelectric properties of Bi3.25La0.75Ti3O12 thin films prepared by the sol-gel method

被引：0
|
作者：
Guo, DY [1 ]
Wang, YB [1 ]
Yu, J [1 ]
Gao, JX [1 ]
机构：
[1] Huazhong Univ Sci & Technol, Dept Elect Sci & Technol, Wuhan 430074, Peoples R China
来源：
JOURNAL OF WUHAN UNIVERSITY OF TECHNOLOGY-MATERIALS SCIENCE EDITION | 2005年 / 20卷 / 04期
关键词：
Bi3.25La0.75Ti3O12; ferroelectric thin film; sol-gel method; leakage current;
D O I：
暂无
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Bi3.25La0.75Ti3O12(BLT) thin films were prepared on Pt/Ti/SO2/Si substrate by the sol-gel method. The effect of annealing on their structures and ferroelectric properties was investigated. The XRD patterns indicate that the BLT films annealed at different temperatures are randomly orientated awl the single perovskite phase is obtained at 550 degrees C. The remnant polarization increases and the coercive field decreases with the annealing temperature increasing. The leakage current density of the BLT films annealed at 700 V is about 5.8 x 10(-8) A/cm(2) at the electric field of 250 kV/cm.
引用
收藏
页码：20 / 21
页数：2
相关论文
共 50 条
  • [21] The effect of orientation on structure and ferroelectric properties of Bi3.25La0.75Ti3O12 thin films
    Kim, KT
    Kim, CI
    SURFACE & COATINGS TECHNOLOGY, 2004, 177 : 770 - 773
  • [22] Frequency dependence of dielectric parameters of structure with Bi3.25La0.75Ti3O12 thin film prepared by sol-gel method
    Tataroglu, A.
    Al-Ghamdi, Ahmed A.
    Yakuphanoglu, F.
    JOURNAL OF OPTOELECTRONICS AND ADVANCED MATERIALS, 2017, 19 (9-10): : 629 - 633
  • [23] Optical properties of Bi3.25La0.75Ti3O12 and Bi3.25Nd0.75Ti3O12 thin films prepared by a chemical solution method
    Ma, JH
    Meng, XJ
    Sun, JL
    Hu, ZG
    Chu, JH
    ACTA PHYSICA SINICA, 2005, 54 (08) : 3900 - 3904
  • [24] Effect of annealing pressure on the structure and ferroelectric properties of Bi3.25La0.75Ti3O12 thin films
    Li Jian-Jun
    Yu Jun
    Li Jia
    Yang Wei-Ming
    Wu Yun-Yi
    Wang Yun-Bo
    ACTA PHYSICA SINICA, 2009, 58 (02) : 1246 - 1251
  • [25] Optical characterization of ferroelectric Bi3.25La0.75Ti3O12 thin films
    Hu, ZG
    Huang, ZM
    Wu, YN
    Hu, SH
    Wang, GS
    Ma, JH
    Chu, JH
    EUROPEAN PHYSICAL JOURNAL B, 2004, 38 (03): : 431 - 436
  • [26] Characterization of ferroelectric Bi3.25La0.75Ti3O12 thin films prepared by metal organic decomposition method
    Kim, KT
    Kim, CI
    THIN SOLID FILMS, 2005, 478 (1-2) : 6 - 12
  • [27] Ferroelectric and dielectric characteristics of Bi3.25La0.75Ti3O12 thin films prepared by the polymeric precursor method
    Simoes, A. Z.
    Ramirez, M. A.
    Stojanovic, B. D.
    Marinkovic, Z.
    Longo, E.
    Varela, J. A.
    ADVANCED MATERIALS FORUM III, PTS 1 AND 2, 2006, 514-516 : 212 - 215
  • [28] Effects of annealing ambient on ferroelectric properties and surface chemistry of sol–gel derived Bi3.25La0.75Ti3O12 thin films
    Jia Li
    Michiko Yoshitake
    Weijie Song
    Journal of Materials Science: Materials in Electronics, 2014, 25 : 343 - 348
  • [29] Characteristics of Bi3.25La0.75Ti3O12 thin films on p-Si with a buffer layer of Bi4Ti3O12 prepared by sol-gel method
    Jun Yu
    Guo Dong-yun
    Wang Yun-bo
    Gao Jun-xiong
    INTEGRATED FERROELECTRICS, 2006, 79 : 89 - 95
  • [30] Structure and ferroelectric properties of Bi3.25La0.75Ti3O12 and Bi3'.25Nd0.75Ti3O12 thin films prepared by a MOD method
    Ma, JH
    Meng, XJ
    Sun, JL
    Lin, T
    Chu, JH
    FIFTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS, 2004, 5774 : 299 - 302
12345