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Impurity Measurements in Polycrystalline Materials with Atom Probe Tomography

被引：0
|
作者：
Ronsheim, P. [1 ]
Hatzistergos, M. [1 ]
Flaitz, P. [1 ]
机构：
[1] IBM Microelect, Hopewell Jct, NY 12533 USA
来源：
MICROSCOPY AND MICROANALYSIS | 2009年 / 15卷
关键词：
D O I：
10.1017/S1431927609097621
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
[No abstract available]
引用
收藏
页码：276 / 277
页数：2
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