Atom Probe Tomography for the Observation of Hydrogen in Materials: A Review

被引：12

作者：

Chen, Yi-Sheng ^{[1
,2
,3
]}

Liu, Pang-Yu ^{[1
,2
]}

Niu, Ranming ^{[1
,2
]}

Devaraj, Arun ^{[4
]}

Yen, Hung-Wei ^{[3
]}

Marceau, Ross K. W. ^{[5
]}

Cairney, Julie M. ^{[1
,2
]}

机构：

[1] Univ Sydney, Australian Ctr Microscopy & Microanal, Sydney, NSW, Australia

[2] Univ Sydney, Sch Aerosp Mech & Mechatron Engn, Sydney, NSW, Australia

[3] Natl Taiwan Univ, Dept Mat Sci & Engn, Taipei, Taiwan

[4] Pacific Northwest Natl Lab, Phys & Computat Sci Directorate, Richland, WA USA

[5] Deakin Univ, Inst Frontier Mat, Geelong, Vic, Australia

来源：

MICROSCOPY AND MICROANALYSIS | 2023年 / 29卷 / 01期

基金：

澳大利亚研究理事会;

关键词：

atom probe tomography; hydride; hydrogen embrittlement; hydrogen mapping; hydrogen trapping; metals; TRAPPING SITES; IMPROVED RESISTANCE; SOLUTE HYDROGEN; STAINLESS-STEEL; GRAIN-BOUNDARY; EMBRITTLEMENT; DEUTERIUM; TITANIUM; SCALE; ALLOYS;

D O I：

10.1093/micmic/ozac005

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Atom probe tomography (APT) is an emerging microscopy technique that has high sensitivity for hydrogen with sub-nanometre-scale spatial resolution, which makes it a unique method to investigate the atomic-scale distribution of hydrogen at interfaces and defects in materials. This article introduces the basics of APT-based hydrogen analysis, particularly the challenge of distinguishing a hydrogen background signal in APT by using hydrogen isotopes, along with strategies to yield high-quality analysis. This article also reviews several important findings on hydrogen distribution in a range of materials, including both structural alloys and functional materials, enabled by using APT. Limitations and future opportunities for hydrogen analysis by APT are also discussed.

引用

页码：1 / 15

页数：15

共 50 条

[1] Review of Atom Probe Tomography Applications for Semiconductor materials
Renaud, L.
Martin, I.
Salle, B.
Benbalagh, R.
Davis, A.
Schuhmacher, M.
[J]. MICROSCOPY AND MICROANALYSIS, 2009, 15 : 262 - 262
[2] Atom probe tomography of electronic materials
Kelly, Thomas F.
Larson, David J.
Thompson, Keith
Alvis, Roger L.
Bunton, Joseph H.
Olson, Jesse D.
Gorman, Brian P.
[J]. ANNUAL REVIEW OF MATERIALS RESEARCH, 2007, 37 : 681 - 727
[3] Modeling Atom Probe Tomography: A review
Vurpillot, F.
Oberdorfer, C.
[J]. ULTRAMICROSCOPY, 2015, 159 : 202 - 216
[4] Atom probe tomography—A cornerstone in materials characterization
Yaron Amouyal
Guido Schmitz
[J]. MRS Bulletin, 2016, 41 : 13 - 18
[5] Characterization of Nanoporous Materials with Atom Probe Tomography
Pfeiffer, Bjoern
Erichsen, Torben
Epler, Eike
Volkert, Cynthia A.
Trompenaars, Piet
Nowak, Carsten
[J]. MICROSCOPY AND MICROANALYSIS, 2015, 21 (03) : 557 - 563
[6] Atom probe tomography of nanoscale electronic materials
Larson, D. J.
Prosa, T. J.
Perea, D. E.
Inoue, K.
Mangelinck, D.
[J]. MRS BULLETIN, 2016, 41 (01) : 30 - 34
[7] Development of Atom Probe Tomography for Biological Materials
Greene, Mark E.
Prosa, Ty J.
Panitz, John A.
Larson, David J.
Kelly, Thomas F.
[J]. MICROSCOPY AND MICROANALYSIS, 2009, 15 : 582 - 583
[8] Atom probe tomography studies of rf materials
Norem, J
Bauer, P
Sebastian, J
Seidman, DN
[J]. 2005 IEEE PARTICLE ACCELERATOR CONFERENCE (PAC), VOLS 1-4, 2005, : 1310 - 1312
[9] Atom probe tomography of nanoscale electronic materials
D. J. Larson
T. J. Prosa
D. E. Perea
K. Inoue
D. Mangelinck
[J]. MRS Bulletin, 2016, 41 : 30 - 34
[10] In Situ Pulsed Hydrogen Implantation in Atom Probe Tomography
Maillet, Jean-Baptiste
Da Costa, Gerald
Klaes, Benjamin
Bacchi, Christian
Normand, Antoine
Vaudaulon, Charly
Vurpillot, Francois
[J]. MICROSCOPY AND MICROANALYSIS, 2024,

← 1 2 3 4 5 →