Rapid Diagnostics of Advanced Standard Cell Using Laser Voltage Probing and Dynamic Laser Stimulation

被引：0
|
作者：
Chen, Li-Qing [1 ]
Sun, Ming-Sheng [1 ]
Chao, Jui-Hao [1 ]
Su, Ke [1 ]
Zhao, Zhe [1 ]
Lin, Guang-Qi [1 ]
机构：
[1] Semicond Mfg Int Corp, Pudong New Area, 18 ZhangJiang Rd, Shanghai 201203, Peoples R China
来源：
2017 IEEE 24TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) | 2017年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Based on Meridian system, failure analysis of an advanced process LCD driver IC were conducted using laser voltage probing (LVP) and dynamic laser stimulation (DLS) techniques. The results demonstrate that LVP technique can effectively track cell transmission signal and intensity, and that failed location can be further identified accurately by using DLS technique followed by layout circuit analysis.
引用
收藏
页数：4
相关论文
共 50 条
  • [1] Rapid diagnostics of ASIC circuit marginalities using dynamic laser stimulation
    Liao, JY
    Woods, GL
    Marks, HL
    [J]. IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY, 2006, 6 (01) : 9 - 16
  • [2] Localization of marginal circuits for yield diagnostics utilizing a dynamic laser stimulation probing system
    Liao, JY
    Woods, GL
    Chen, X
    Marks, HL
    [J]. MICROELECTRONICS RELIABILITY, 2005, 45 (9-11) : 1554 - 1557
  • [3] Rapid diagnostics of an ASIC IP block using dynamic laser scanning
    Liao, JY
    Chen, XD
    Marks, HL
    Nishizaki, C
    Woods, GL
    Vedagarbha, P
    Nataraj, N
    [J]. IPFA 2005: Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2005, : 27 - 31
  • [4] Laser Voltage Imaging: A new Perspective of Laser Voltage Probing
    Ng, Yin S.
    Lundquist, Ted
    Skvortsov, Dmitry
    Liao, Joy
    Kasapi, Steven
    Marks, Howard
    [J]. ISTFA 2010: CONFERENCE PROCEEDINGS FROM THE 36TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2010, : 5 - +
  • [5] Combinational Logic Analysis using Laser Voltage Probing
    Ravikumar, Venkat Krishnan
    Lua, Winson
    Xuan, Seah Yi
    Ranganathan, Gopinath
    Phoa, Angeline
    [J]. ISTFA 2015: CONFERENCE PROCEEDINGS FROM THE 41ST INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2015, : 35 - 41
  • [6] Laser Voltage Probing in Failure Analysis of Advanced Integrated Circuits on SOI
    Ravikumar, V. K.
    Wampler, R.
    Ho, M. Y.
    Christensen, J.
    Phoa, S. L.
    [J]. 2012 19TH IEEE INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2012,
  • [7] Laser Voltage Probing in Failure Analysis of Advanced Integrated Circuits on SOI
    Ravikumar, V. K.
    Wampler, R.
    Ho, M. Y.
    Christensen, J.
    Phoa, S. L.
    [J]. ISTFA 2012: CONFERENCE PROCEEDINGS FROM THE 38TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2012, : 1 - 5
  • [8] Next Generation Laser Voltage Probing
    Ng, Yin S.
    Lo, William
    Wilsher, Kenneth
    [J]. ISTFA 2008: CONFERENCE PROCEEDINGS FROM THE 34TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS, 2008, : 249 - 255
  • [9] Laser multipass probing in Thomson plasma diagnostics
    Kantor, MY
    Kuprienko, DV
    [J]. TECHNICAL PHYSICS LETTERS, 1997, 23 (04) : 321 - 323
  • [10] Laser multipass probing in Thomson plasma diagnostics
    M. Yu. Kantor
    D. V. Kuprienko
    [J]. Technical Physics Letters, 1997, 23 : 321 - 323
12345