Rapid Diagnostics of Advanced Standard Cell Using Laser Voltage Probing and Dynamic Laser Stimulation

被引：0

作者：

Chen, Li-Qing ^{[1
]}

Sun, Ming-Sheng ^{[1
]}

Chao, Jui-Hao ^{[1
]}

Su, Ke ^{[1
]}

Zhao, Zhe ^{[1
]}

Lin, Guang-Qi ^{[1
]}

机构：

[1] Semicond Mfg Int Corp, Pudong New Area, 18 ZhangJiang Rd, Shanghai 201203, Peoples R China

来源：

2017 IEEE 24TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA) | 2017年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Based on Meridian system, failure analysis of an advanced process LCD driver IC were conducted using laser voltage probing (LVP) and dynamic laser stimulation (DLS) techniques. The results demonstrate that LVP technique can effectively track cell transmission signal and intensity, and that failed location can be further identified accurately by using DLS technique followed by layout circuit analysis.

引用

页数：4

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