Scaling-up a liquid water jet laser plasma source to high average power for Extreme Ultraviolet Lithography

被引:10
|
作者
Vogt, U [1 ]
Stiel, H [1 ]
Will, I [1 ]
Wieland, M [1 ]
Wilhein, T [1 ]
Nickles, PV [1 ]
Sandner, W [1 ]
机构
[1] Max Born Inst Nonlinear Opt & Short Pulse Spect, D-12489 Berlin, Germany
来源
关键词
EUV lithography; laser produced plasma; liquid water jet source; high average power lasers;
D O I
10.1117/12.436685
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
In this article we describe a laser plasma source for Extreme Ultraviolet Lithography (EUVL) based on a liquid water jet target. Although jet targets are known for some time now, no attempts have been made to prove the functionality of the target under conditions similar to an EUVL production-line facility, that means illumination with high average power laser systems (in the multi-kW regime) at repetition rates in the kHz region. Such systems are currently under development. We used the MBI-burst laser to simulate these extreme illumination conditions. We examined the hydrodynamic stability of the target as a function of the laser repetition rate at different average laser powers (0.6kW and 5kW per burst). Additionally, the dependence of the conversion efficiency on pulse duration in the range from 30ps to 3ns was investigated. From our results one can conclude parameters for future design of driver lasers for EUVL systems.
引用
收藏
页码:535 / 542
页数:8
相关论文
共 50 条
  • [1] Scale-up of a cluster jet laser plasma source for Extreme Ultraviolet Lithography
    Kubiak, GD
    Bernardez, LJ
    Krenz, K
    Sweatt, WC
    [J]. EMERGING LITHOGRAPHIC TECHNOLOGIES III, PTS 1 AND 2, 1999, 3676 : 669 - 678
  • [2] Power scaling of an extreme ultraviolet light source for future lithography
    Wagenaars, Erik
    Kuepper, Felix
    Klein, Juergen
    Neff, Willi
    Damen, Marcel
    van der Wel, Pieter
    Vaudrevange, Dominik
    Jonkers, Jeroen
    [J]. APPLIED PHYSICS LETTERS, 2008, 92 (18)
  • [3] Extreme ultraviolet spectroscopy of a laser plasma source for lithography
    Shevelko, AP
    Shmaenok, LA
    Churilov, SS
    Bastiaensen, RKFJ
    Bijkerk, F
    [J]. PHYSICA SCRIPTA, 1998, 57 (02): : 276 - 282
  • [4] Development of a plasma laser source for lithography in extreme ultraviolet
    Soullié, G
    Lafon, C
    Rosch, R
    Babonneau, D
    Garaude, F
    Huelvan, S
    Trublet, T
    Bonnet, L
    Marmoret, R
    [J]. JOURNAL DE PHYSIQUE IV, 2003, 108 : 275 - 279
  • [5] Extreme ultraviolet spectroscopy of a laser plasma source for lithography
    Bijkerk, F
    Shevelko, AP
    Shmaenok, LA
    Churilov, SS
    [J]. APPLICATIONS OF X RAYS GENERATED FROM LASERS AND OTHER BRIGHT SOURCES, 1997, 3157 : 236 - 240
  • [6] Laser-produced plasma light source for extreme ultraviolet lithography
    Shields, H
    Fornaca, SW
    Petach, MB
    Orsini, RA
    Moyer, RH
    St Pierre, RJ
    [J]. PROCEEDINGS OF THE IEEE, 2002, 90 (10) : 1689 - 1695
  • [7] NEW LASER-PLASMA SOURCE FOR EXTREME-ULTRAVIOLET LITHOGRAPHY
    JIN, F
    RICHARDSON, M
    [J]. APPLIED OPTICS, 1995, 34 (25): : 5750 - 5760
  • [8] Characterization of a liquid-xenon-jet laser-plasma extreme-ultraviolet source
    Hansson, BAM
    Hemberg, O
    Hertz, HM
    Berglund, M
    Choi, HJ
    Jacobsson, B
    Janin, E
    Mosesson, S
    Rymell, L
    Thoresen, J
    Wilner, M
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (06): : 2122 - 2129
  • [9] A laser-generated water plasma source for extreme-ultraviolet lithography and at-wavelength interferometry
    Constantinescu, RC
    Jonkers, J
    Hegeman, P
    Visser, M
    [J]. SOFT X-RAY AND EUV IMAGING SYSTEMS, 2000, 4146 : 101 - 112
  • [10] High-power source and illumination system for extreme ultraviolet lithography
    Kubiak, GD
    Bernardez, LJ
    Krenz, K
    Replogle, WC
    Sweatt, WC
    Sweeney, DW
    Hudyma, RM
    Shields, H
    [J]. EUV, X-RAY, AND NEUTRON OPTICS AND SOURCES, 1999, 3767 : 136 - 142