Comparative analysis of pseudo-potential and tight-binding band structure calculations with an analytical two-band k.p model: Conduction band of silicon

被引:0
|
作者
Sverdlov, Viktor A. [1 ]
Kosina, Hans [1 ]
Selberherr, Siegfried [1 ]
机构
[1] Vienna Univ Technol, Inst Microelect, A-1040 Vienna, Austria
来源
关键词
silicon band structure; k.p theory; tight-binding method; empirical pseudo-potential method;
D O I
10.1117/12.802503
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
An analytical two-band k.p model for the conduction band of silicon is compared with the numerical nonlocal empirical pseudo-potential method and the sp(3)d(5)S* nearest-neighbor tight-binding model. The two-band k.p model gives results consistent with the empirical pseudo-potential method and describes the conduction band structure accurately. The tight-binding model overestimates the gap between the two lowest conduction bands at the valley minima, which results in an underestimation of the non-parabolicity effects. When shear strain is introduced, the two-band k.p model predicts an analytical expression for the strain-dependence of the band structure, which is in good agreement with results of pseudo-potential simulations.
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页数:8
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