Quantitative non-contact dynamic Casimir force measurements

被引:71
|
作者
Jourdan, G. [1 ,2 ,3 ]
Lambrecht, A. [3 ]
Comin, F. [4 ]
Chevrier, J. [1 ,2 ,4 ]
机构
[1] UJF, CNRS, Inst Neel, F-38042 Grenoble 9, France
[2] Univ Grenoble 1, F-38041 Grenoble 9, France
[3] UPMC, ENS, CNRS, Lab Kastler Brossel, F-75252 Paris 05, France
[4] ESRF, F-38043 Grenoble, France
关键词
SILICON;
D O I
10.1209/0295-5075/85/31001
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We show that the Casimir force (CF) gradient can be measured with no contact involved. Results of the CF measurement with systematic uncertainty of 3% are presented for the distance range of 100-600 nm. The statistical uncertainty is shown to be due to the thermal fluctuations of the force probe. The corresponding signal-to-noise ratio equals unity at the distance of 600 nm. Direct contact between surfaces used in most previous studies to determine absolute distance separation is here precluded. Use of direct contact to identify the origin of distances is a severe limitation for studies of the CF on structured surfaces as it deteriorates irreversibly the studied surface and the probe. This force machine uses a dynamical method with an inserted gold sphere probe glued to a lever. The lever is mechanically excited at resonant frequency in front of a chosen sample. The absolute distance determination is achieved to be possible, without any direct probe/sample contact, using an electrostatic method associated to a real time correction of the mechanical drift. The positioning shift uncertainty is as low as 2 nm. Use of this instrument to probe a very thin film of gold (10 nm) reveals important spatial variations in the measurement. Copyright (C) EPLA, 2009
引用
收藏
页数:5
相关论文
共 50 条
  • [1] Quantitative methods for non-contact electrostatic force microscopy
    Baird, PJS
    Bowler, JR
    Stevens, GC
    ELECTROSTATICS 1999, 1999, 163 : 381 - 386
  • [2] Design and Fabrication of Novel Devices Using the Casimir Force for Non-contact Actuation
    Carter, Emma L.
    Ward, Michael
    Anthony, Carl
    2009 IEEE SENSORS, VOLS 1-3, 2009, : 229 - 233
  • [3] Quantitative assessment of contact and non-contact lateral force calibration methods for atomic force microscopy
    Bien Cuong Tran Khac
    Chung, Koo-Hyun
    ULTRAMICROSCOPY, 2016, 161 : 41 - 50
  • [4] Rapid non-contact tension force measurements on stay cables
    Schmieder, Marcus
    Taylor-Noonan, Alex
    Heere, Roland
    BRIDGE MAINTENANCE, SAFETY, MANAGEMENT, RESILIENCE AND SUSTAINABILITY, 2012, : 3799 - 3805
  • [5] Non-contact optical dynamic measurements at different ranges: a review
    Fu, Yu
    Shang, Yang
    Hu, Wenxin
    Li, Bin
    Yu, Qifeng
    ACTA MECHANICA SINICA, 2021, 37 (04) : 537 - 553
  • [6] Non-contact optical dynamic measurements at different ranges: a review
    Yu Fu
    Yang Shang
    Wenxin Hu
    Bin Li
    Qifeng Yu
    Acta Mechanica Sinica, 2021, 37 : 537 - 553
  • [7] Influence of uncompensated electrostatic force on height measurements in non-contact atomic force microscopy
    Sadewasser, S
    Carl, P
    Glatzel, T
    Lux-Steiner, MC
    NANOTECHNOLOGY, 2004, 15 (02) : S14 - S18
  • [8] Towards atomic resolution non-contact dynamic force microscopy in a liquid
    Ohnesorge, F.M.
    Surface and Interface Analysis, 1999, 27 (05): : 379 - 385
  • [9] Towards atomic resolution non-contact dynamic force microscopy in a liquid
    Ohnesorge, FM
    SURFACE AND INTERFACE ANALYSIS, 1999, 27 (5-6) : 379 - 385
  • [10] Contact and Non-contact Measurements of Grinding Pins
    Magdziak, Marek
    Wdowik, Roman
    2015 4TH INTERNATIONAL CONFERENCE ON MECHANICS AND CONTROL ENGINEERING (ICMCE 2015), 2015, 35