Leakage Reduction by Test Pattern Reordering

被引：1
|
作者：
Chakraborty, Shrabanti [1 ]
Sarkar, Trupa [1 ]
Pradhan, Sambhu Nath [1 ]
机构：
[1] Natl Inst Technol, Dept ECE, Agartala, India
来源：
PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANO-ELECTRONICS, CIRCUITS & COMMUNICATION SYSTEMS | 2017年 / 403卷
关键词：
D O I：
10.1007/978-981-10-2999-8_5
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：55 / 68
页数：14
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