Leakage Reduction by Test Pattern Reordering

被引：1

作者：

Chakraborty, Shrabanti ^{[1
]}

Sarkar, Trupa ^{[1
]}

Pradhan, Sambhu Nath ^{[1
]}

机构：

[1] Natl Inst Technol, Dept ECE, Agartala, India

来源：

PROCEEDINGS OF THE INTERNATIONAL CONFERENCE ON NANO-ELECTRONICS, CIRCUITS & COMMUNICATION SYSTEMS | 2017年 / 403卷

关键词：

D O I：

10.1007/978-981-10-2999-8_5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：55 / 68

页数：14

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