Distorted surface topography observed by atomic force microscopy

被引：4
|
作者：
Li, LA
Liu, RP [1 ]
Xu, Z
Xu, Y
Wang, WK
Fan, CZ
机构：
[1] Yanshan Univ, Key Lab Metastable Mat Sci & Technol, Qinhuangdao, Peoples R China
[2] Chinese Acad Sci, Inst Phys, Beijing 100080, Peoples R China
来源：
MEASUREMENT | 2006年 / 39卷 / 01期
基金：
中国国家自然科学基金;
关键词：
AFM; Au film; image distortion;
D O I：
10.1016/j.measurement.2005.10.005
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Topography of Au thin films deposited by magnetron sputtering technique on a silicon substrate was studied by atomic force microscopy (AFM). Distortion of the surface morphologies as a result of interaction between the film and the probe tip was observed. Some topographical morphologies that look like perfect were distorted, Thus, the reality of the topography by AFM, in some cases, needs to be re-evaluated. (C) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码：12 / 15
页数：4
相关论文
共 50 条
  • [1] The topography of soft, adhesive diatom 'trails' as observed by atomic force microscopy
    Higgins, MJ
    Crawford, SA
    Mulvaney, P
    Wetherbee, R
    [J]. BIOFOULING, 2000, 16 (2-4) : 133 - 139
  • [2] Characterisation of multiphase steel surface topography by atomic force microscopy
    Yáñez, TR
    Houbaert, Y
    [J]. PRAKTISCHE METALLOGRAPHIE-PRACTICAL METALLOGRAPHY, 2002, 39 (04): : 202 - 210
  • [3] An atomic force microscopy investigation of protein crystal surface topography
    Mollica, V
    Borassi, A
    Relini, A
    Cavalleri, O
    Bolognesi, M
    Rolandi, R
    Gliozzi, A
    [J]. EUROPEAN BIOPHYSICS JOURNAL WITH BIOPHYSICS LETTERS, 2001, 30 (05): : 313 - 318
  • [4] An atomic force microscopy investigation of protein crystal surface topography
    Levadoux M.
    Gadea J.
    Flandrin P.
    Carlos E.
    Aswad R.
    Panuel M.
    [J]. European Biophysics Journal, 2001, 30 (5) : 313 - 318
  • [5] Improving Accuracy of Sample Surface Topography by Atomic Force Microscopy
    Xu, Mingsheng
    Fujita, Daisuke
    Onishi, Keiko
    Miyazawa, Kunichi
    [J]. JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, 2009, 9 (10) : 6003 - 6007
  • [6] Surface structure of deciduous enamel observed by atomic force microscopy
    Motoyama, M
    Daito, M
    Uemura, M
    Kambara, M
    [J]. JOURNAL OF DENTAL RESEARCH, 1998, 77 : 715 - 715
  • [7] SURFACE OF GAAS/SI OBSERVED BY ATOMIC-FORCE MICROSCOPY
    MORI, H
    TACHIKAWA, M
    YAMADA, T
    SASAKI, T
    [J]. JOURNAL OF CRYSTAL GROWTH, 1995, 154 (1-2) : 23 - 26
  • [8] Atomic steps on sublimating Si(001) surface observed by atomic force microscopy
    Rodyakina, EE
    Kosolobov, SS
    Sheglov, DV
    Nasimov, DA
    Song, SA
    Latyshev, AV
    [J]. PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 2004, 1-2 : 9 - 17
  • [9] Study of the surface topography of graphite materials using atomic force microscopy
    Gu, JL
    Leng, Y
    [J]. CARBON, 1999, 37 (06) : 991 - 994
  • [10] Fracture surface topography of energetic materials using atomic force microscopy
    Lanzerotti, MYD
    Meisel, LV
    Johnson, MA
    Wolfe, A
    Thomson, DJ
    [J]. ATOMIC RESOLUTION MICROSCOPY OF SURFACES AND INTERFACES, 1997, 466 : 179 - 184
12345